Wie (gut) gehts euren Festplatten

[Sje]

Sehr komisch, ich kann das nich reproduzieren mit HD Tune Pro 5.00 ...

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Platten aus'm Bastelrechner:

[Xaar]

Die beiden 750GB Samsungs, die ich heute in das "alte" USB 2.0-RAID-Gehäuse eingebaut habe:

Code:

smartctl 5.41 2011-03-16 r3296 [x86_64-unknown-linux-gnu-2.6.38-grml64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F3 series
Device Model:     SAMSUNG HD754JJ
Serial Number:    S281J90Z502930
Firmware Version: 1AJ10001
User Capacity:    750.156.374.016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Mon Jul  9 16:07:25 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever
                    been run.
Total time to complete Offline
data collection:         ( 6780) seconds.
Offline data collection
capabilities:              (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      ( 113) minutes.
SCT capabilities:            (0x003f)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   100   051    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   070   069   025    Pre-fail  Always       -       9228
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       79
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       103
10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       80
191 G-Sense_Error_Rate      0x0022   100   100   000    Old_age   Always       -       3
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   064   064   000    Old_age   Always       -       24 (Min/Max 15/36)
195 Hardware_ECC_Recovered  0x003a   100   100   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   100   100   000    Old_age   Always       -       1
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       82

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Code:

smartctl 5.41 2011-03-16 r3296 [x86_64-unknown-linux-gnu-2.6.38-grml64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F3 series
Device Model:     SAMSUNG HD754JJ
Serial Number:    S281J90Z502932
Firmware Version: 1AJ10001
User Capacity:    750.156.374.016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Mon Jul  9 16:07:30 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)    Offline data collection activity
                    was never started.
                    Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)    The previous self-test routine completed
                    without error or no self-test has ever
                    been run.
Total time to complete Offline
data collection:         ( 6540) seconds.
Offline data collection
capabilities:              (0x5b) SMART execute Offline immediate.
                    Auto Offline data collection on/off support.
                    Suspend Offline collection upon new
                    command.
                    Offline surface scan supported.
                    Self-test supported.
                    No Conveyance Self-test supported.
                    Selective Self-test supported.
SMART capabilities:            (0x0003)    Saves SMART data before entering
                    power-saving mode.
                    Supports SMART auto save timer.
Error logging capability:        (0x01)    Error logging supported.
                    General Purpose Logging supported.
Short self-test routine
recommended polling time:      (   2) minutes.
Extended self-test routine
recommended polling time:      ( 109) minutes.
SCT capabilities:            (0x003f)    SCT Status supported.
                    SCT Error Recovery Control supported.
                    SCT Feature Control supported.
                    SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   100   051    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   071   070   025    Pre-fail  Always       -       8857
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       81
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       103
10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       91
191 G-Sense_Error_Rate      0x0022   252   252   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   064   064   000    Old_age   Always       -       24 (Min/Max 16/33)
195 Hardware_ECC_Recovered  0x003a   100   100   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   100   100   000    Old_age   Always       -       1
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       92

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Sind als Ersatz für die beiden Western Digital WD15EARS, die rumspacken. Sind zwar 7200er, die beiden Samsungs, aber der Lüffi im Gehäuse hält die durchaus auf einem akzeptablen Temperatur-Niveau. Die beiden WDs werd ich dann mal mit Badblocks bearbeiten - wie auch die beiden Samsung HD153WI, die ich noch hier habe (die wiederum ins "neue" USB 3.0-RAID-Gehäuse kommen). Was ich mit den beiden WDs anstelle, weiß ich noch nicht..

[HobbyBastler]

(09.07.2012 21:35)Sje schrieb:  Platten aus'm Bastelrechner:

Hab auch eine Maxtor die ebenfalls eine Hohe Temp bekommt.
Maxtor 6Y080M0 (80GB)
Scheint wohl normal bei Maxtor damals gewesen zu sein bei diesen Modelle.
meine war damals 55°C im normalbetrieb.

[Sje]

Bei meiner spinnt der Sensor, die 48°C von der WD erscheinen Realistischer, da sich beide Platten gleich heiß anfühlen.

[HobbyBastler]

Aso, bei meiner Maxtor Platte haben viele andere die gleichen Probleme laut google.
Wenn man das als Problem bezeichnen kann oder ob es normal ist das meine zwischen 50°C und 60°C befindet.

[Pain]

(09.07.2012 23:40)HobbyBastler schrieb:  55°C im normalbetrieb.

In der Tat, die beiden DiamondMax die ich habe, besonders da die 6Y120P0 ist ein heisser und lauter Kandidat.

[Sje]

Notebook:

[Pain]

HP compaq nc6000:

[Sje]

20 GB IBM Deathstar

[CDW]