Wie (gut) gehts euren Festplatten

Sje · seit dem 26.10.2006 dabei

Sehr komisch, ich kann das nich reproduzieren mit HD Tune Pro 5.00 ...

Platten aus'm Bastelrechner:

**Xaar**

Die beiden 750GB Samsungs, die ich heute in das "alte" USB 2.0-RAID-Gehäuse eingebaut habe:

Code

smartctl 5.41 2011-03-16 r3296 [x86_64-unknown-linux-gnu-2.6.38-grml64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net


=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F3 series
Device Model:     SAMSUNG HD754JJ
Serial Number:    S281J90Z502930
Firmware Version: 1AJ10001
User Capacity:    750.156.374.016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Mon Jul  9 16:07:25 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled


=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED


General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		( 6780) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 113) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.


SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   100   051    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   070   069   025    Pre-fail  Always       -       9228
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       79
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       103
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       80
191 G-Sense_Error_Rate      0x0022   100   100   000    Old_age   Always       -       3
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   064   064   000    Old_age   Always       -       24 (Min/Max 15/36)
195 Hardware_ECC_Recovered  0x003a   100   100   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   100   100   000    Old_age   Always       -       1
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       82


SMART Error Log Version: 1
No Errors Logged


SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]




Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Alles anzeigen

Code

smartctl 5.41 2011-03-16 r3296 [x86_64-unknown-linux-gnu-2.6.38-grml64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net


=== START OF INFORMATION SECTION ===
Model Family:     SAMSUNG SpinPoint F3 series
Device Model:     SAMSUNG HD754JJ
Serial Number:    S281J90Z502932
Firmware Version: 1AJ10001
User Capacity:    750.156.374.016 bytes
Device is:        In smartctl database [for details use: -P show]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 6
Local Time is:    Mon Jul  9 16:07:30 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled


=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED


General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		( 6540) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 109) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.


SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x002f   100   100   051    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0026   252   252   000    Old_age   Always       -       0
  3 Spin_Up_Time            0x0023   071   070   025    Pre-fail  Always       -       8857
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       81
  5 Reallocated_Sector_Ct   0x0033   252   252   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x002e   252   252   051    Old_age   Always       -       0
  8 Seek_Time_Performance   0x0024   252   252   015    Old_age   Offline      -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       103
 10 Spin_Retry_Count        0x0032   252   252   051    Old_age   Always       -       0
 11 Calibration_Retry_Count 0x0032   252   252   000    Old_age   Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       91
191 G-Sense_Error_Rate      0x0022   252   252   000    Old_age   Always       -       0
192 Power-Off_Retract_Count 0x0022   252   252   000    Old_age   Always       -       0
194 Temperature_Celsius     0x0002   064   064   000    Old_age   Always       -       24 (Min/Max 16/33)
195 Hardware_ECC_Recovered  0x003a   100   100   000    Old_age   Always       -       0
196 Reallocated_Event_Count 0x0032   252   252   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   252   252   000    Old_age   Always       -       0
198 Offline_Uncorrectable   0x0030   252   252   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0036   200   200   000    Old_age   Always       -       0
200 Multi_Zone_Error_Rate   0x002a   100   100   000    Old_age   Always       -       1
223 Load_Retry_Count        0x0032   252   252   000    Old_age   Always       -       0
225 Load_Cycle_Count        0x0032   100   100   000    Old_age   Always       -       92


SMART Error Log Version: 1
No Errors Logged


SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]




Note: selective self-test log revision number (0) not 1 implies that no selective self-test has ever been run
SMART Selective self-test log data structure revision number 0
Note: revision number not 1 implies that no selective self-test has ever been run
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Completed [00% left] (0-65535)
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Alles anzeigen

Sind als Ersatz für die beiden Western Digital WD15EARS, die rumspacken. Sind zwar 7200er, die beiden Samsungs, aber der Lüffi im Gehäuse hält die durchaus auf einem akzeptablen Temperatur-Niveau. Die beiden WDs werd ich dann mal mit Badblocks bearbeiten - wie auch die beiden Samsung HD153WI, die ich noch hier habe (die wiederum ins "neue" USB 3.0-RAID-Gehäuse kommen). Was ich mit den beiden WDs anstelle, weiß ich noch nicht..

HobbyBastler

Zitat von Sje

Platten aus'm Bastelrechner:

Hab auch eine Maxtor die ebenfalls eine Hohe Temp bekommt.
Maxtor 6Y080M0 (80GB)
Scheint wohl normal bei Maxtor damals gewesen zu sein bei diesen Modelle.
meine war damals 55°C im normalbetrieb.

Sje · seit dem 26.10.2006 dabei

Bei meiner spinnt der Sensor, die 48°C von der WD erscheinen Realistischer, da sich beide Platten gleich heiß anfühlen.

HobbyBastler

Aso, bei meiner Maxtor Platte haben viele andere die gleichen Probleme laut google.
Wenn man das als Problem bezeichnen kann oder ob es normal ist das meine zwischen 50°C und 60°C befindet.

**Pain**

Zitat von HobbyBastler

55°C im normalbetrieb.

In der Tat, die beiden DiamondMax die ich habe, besonders da die 6Y120P0 ist ein heisser und lauter Kandidat.

Sje · seit dem 26.10.2006 dabei

Notebook:

**Pain**

HP compaq nc6000:

Sje · seit dem 26.10.2006 dabei

20 GB IBM Deathstar

**CDW**

PacMani

Was bringt der Thread eigentlich?
Interessant wäre doch hierzu ein Balkendiagramm mit Herstellernamen und dann grün/gelb/rot die Festplattenzustände, oder? Dann hat man auch einen Schluss aus den Berichten gezogen.

Sowas z.B.

**Spit**

western digital is das beste am markt alle anderen haben keine ahnung und sollen sich verziehen

**CDW**

Zitat von Spit

western digital is das beste am markt alle anderen haben keine ahnung und sollen sich verziehen

Hab in meinem HauptPC intern und extern nur WD. Hammer wie langlebig die Dinger meist sind.

**Xaar**

Zitat von Spit

western digital is das beste am markt alle anderen haben keine ahnung und sollen sich verziehen

Klar, aus diesem Grund sind bei mir auch zwei de facto identische WD15EARS urplötzlich unterschiedlich schnell.. Oder Desktop-Platten parken ihre Köpfe nach wenigen Sekunden, so das die Platte mehr oder weniger immer mit ein- und ausparken beschäftigt ist - und so die Ladezyklen hochschnellen..

**CDW**

Zitat von Xaar

Klar, aus diesem Grund sind bei mir auch zwei de facto identische WD15EARS urplötzlich unterschiedlich schnell.. Oder Desktop-Platten parken ihre Köpfe nach wenigen Sekunden, so das die Platte mehr oder weniger immer mit ein- und ausparken beschäftigt ist - und so die Ladezyklen hochschnellen..

Dann benutze Sie falsch

**Xaar**

Wieso soll ich die denn falsch benutzen?
Das mit den Ladezyklen liegt an der Firmware (wobei in dem Zusammenhang ja durchaus Besserung möglich ist), woran das mit der Datenübertragungsrate liegt, weiß ich nicht. Die Festplatten sind gleich alt, haben die selbe Firmware und laufen auch an verschiedenen Ports im Rechner (auch nicht einem Anderen) nicht anders. Kann also nur an den Platten liegen.

Sje · seit dem 26.10.2006 dabei

Zitat von Xaar

Wieso soll ich die denn falsch benutzen?
Das mit den Ladezyklen liegt an der Firmware (wobei in dem Zusammenhang ja durchaus Besserung möglich ist), woran das mit der Datenübertragungsrate liegt, weiß ich nicht. Die Festplatten sind gleich alt, haben die selbe Firmware und laufen auch an verschiedenen Ports im Rechner (auch nicht einem Anderen) nicht anders. Kann also nur an den Platten liegen.

Die Platten müssen bloß mal mit'm WDIDLE-Tool eingestellt werden.
Hab ich bei all meinen WD's gemacht und es klappt auch bei fast allen Platten.
Bei deinen EARS-Platten ,müsste das auch klappern, hab selbst ne WD20EARS erfolgreich vom Köpfe parken kuriert.

thosch97

Code

smartctl 5.41 2011-06-09 r3365 [i686-linux-3.1.0-3-grml-486] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net


=== START OF INFORMATION SECTION ===
Device Model:     TOSHIBA MK5061GSY
Serial Number:    71P1B0HGB
LU WWN Device Id: 5 000039 369185aed
Firmware Version: MC102E
User Capacity:    500,107,862,016 bytes [500 GB]
Sector Size:      512 bytes logical/physical
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  Exact ATA specification draft version not indicated
Local Time is:    Sat Jul 21 21:04:18 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled


=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED


General SMART Values:
Offline data collection status:  (0x82)	Offline data collection activity
					was completed without error.
					Auto Offline Data Collection: Enabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		(  120) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 ( 133) minutes.
SCT capabilities: 	       (0x003f)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.


SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  1 Raw_Read_Error_Rate     0x000b   100   100   050    Pre-fail  Always       -       0
  2 Throughput_Performance  0x0005   100   100   050    Pre-fail  Offline      -       0
  3 Spin_Up_Time            0x0027   100   100   001    Pre-fail  Always       -       1493
  4 Start_Stop_Count        0x0032   100   100   000    Old_age   Always       -       1232
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  7 Seek_Error_Rate         0x000b   100   100   050    Pre-fail  Always       -       0
  8 Seek_Time_Performance   0x0005   100   100   050    Pre-fail  Offline      -       0
  9 Power_On_Hours          0x0032   098   098   000    Old_age   Always       -       1066
 10 Spin_Retry_Count        0x0033   124   100   030    Pre-fail  Always       -       0
 12 Power_Cycle_Count       0x0032   100   100   000    Old_age   Always       -       1105
191 G-Sense_Error_Rate      0x0032   100   100   000    Old_age   Always       -       4
192 Power-Off_Retract_Count 0x0032   100   100   000    Old_age   Always       -       19
193 Load_Cycle_Count        0x0032   099   099   000    Old_age   Always       -       19319
194 Temperature_Celsius     0x0022   100   100   000    Old_age   Always       -       41 (Min/Max 10/48)
196 Reallocated_Event_Count 0x0032   100   100   000    Old_age   Always       -       0
197 Current_Pending_Sector  0x0032   100   100   000    Old_age   Always       -       10
198 Offline_Uncorrectable   0x0030   100   100   000    Old_age   Offline      -       0
199 UDMA_CRC_Error_Count    0x0032   200   200   000    Old_age   Always       -       0
220 Disk_Shift              0x0002   100   100   000    Old_age   Always       -       8416
222 Loaded_Hours            0x0032   098   098   000    Old_age   Always       -       954
223 Load_Retry_Count        0x0032   100   100   000    Old_age   Always       -       0
224 Load_Friction           0x0022   100   100   000    Old_age   Always       -       0
226 Load-in_Time            0x0026   100   100   000    Old_age   Always       -       368
240 Head_Flying_Hours       0x0001   100   100   001    Pre-fail  Offline      -       0


SMART Error Log Version: 1
ATA Error Count: 758 (device log contains only the most recent five errors)
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.


Error 758 occurred at disk power-on lifetime: 1065 hours (44 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 41 02 29 08 ab 60  Error: UNC at LBA = 0x00ab0829 = 11208745


  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 07 00 29 08 ab 40 00      00:08:02.075  READ FPDMA QUEUED
  ef 10 02 00 00 00 a0 00      00:08:02.074  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 00      00:08:02.073  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:08:02.073  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 00      00:08:02.073  SET FEATURES [Set transfer mode]


Error 757 occurred at disk power-on lifetime: 1065 hours (44 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 41 02 29 08 ab 60  Error: UNC at LBA = 0x00ab0829 = 11208745


  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 07 00 29 08 ab 40 00      00:07:58.975  READ FPDMA QUEUED
  ef 10 02 00 00 00 a0 00      00:07:58.974  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 00      00:07:58.974  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:07:58.973  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 00      00:07:58.973  SET FEATURES [Set transfer mode]


Error 756 occurred at disk power-on lifetime: 1065 hours (44 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 41 02 29 08 ab 60  Error: UNC at LBA = 0x00ab0829 = 11208745


  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 07 00 29 08 ab 40 00      00:07:55.549  READ FPDMA QUEUED
  ef 10 02 00 00 00 a0 00      00:07:55.549  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 00      00:07:55.549  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:07:55.548  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 00      00:07:55.548  SET FEATURES [Set transfer mode]


Error 755 occurred at disk power-on lifetime: 1065 hours (44 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 41 02 29 08 ab 60  Error: UNC at LBA = 0x00ab0829 = 11208745


  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 07 00 29 08 ab 40 00      00:07:52.417  READ FPDMA QUEUED
  ef 10 02 00 00 00 a0 00      00:07:52.417  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 00      00:07:52.417  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:07:52.416  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 00      00:07:52.416  SET FEATURES [Set transfer mode]


Error 754 occurred at disk power-on lifetime: 1065 hours (44 days + 9 hours)
  When the command that caused the error occurred, the device was active or idle.


  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 41 02 29 08 ab 60  Error: UNC at LBA = 0x00ab0829 = 11208745


  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 07 00 29 08 ab 40 00      00:07:49.225  READ FPDMA QUEUED
  ef 10 02 00 00 00 a0 00      00:07:49.225  SET FEATURES [Reserved for Serial ATA]
  27 00 00 00 00 00 e0 00      00:07:49.225  READ NATIVE MAX ADDRESS EXT
  ec 00 00 00 00 00 a0 00      00:07:49.224  IDENTIFY DEVICE
  ef 03 45 00 00 00 a0 00      00:07:49.224  SET FEATURES [Set transfer mode]


SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Completed without error       00%       928         -
# 2  Short offline       Completed without error       00%       843         -
# 3  Short offline       Completed without error       00%       778         -
# 4  Short offline       Completed without error       00%       722         -
# 5  Short offline       Completed without error       00%       491         -
# 6  Short offline       Completed without error       00%        20         -


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.

Alles anzeigen

Jap. Die hatte nen Headcrash, wurde samt Laptop vom Tisch gefegt.

**Xaar**

Bei den EARS ist das Problem ja nicht die Köpfe-Parkerei sondern schlichtweg die nicht erklärliche Performance-Differenz. Das WDIDLE-Tool meine ich mit dem "durchaus Besserung möglich" - funktioniert aber nicht bei allen Platten.

Sje · seit dem 26.10.2006 dabei

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