Hallöchen!
Ich hab hier ja zwei 1,5TB RAID1 am Laufen gehabt. Da eins davon in letzter Zeit immer wieder Probleme bereitet hat, hab ich mal alle 4 Platten mit dem Program badblocks bearbeitet, um zu schauen, wie es so bezüglich defekter Sektoren ausschaut. Zwei der Festplatten sind Samsung HD153WI (SpinPoint F3 Eco Green), zwei Western Digital WD15EARS (Caviar Green). Nun habe ich bei einer der beiden WDs festgestellt, dass die ziemlich lange für badblocks (Parameter: svwf, also zerstörerisches Schreiben in 4 Durchgängen) braucht.
Nachdem nun alle 4 Platten vollständig durchgelaufen waren, hab ich mir mal die SMART-Werte aller Platten angesehen - allesamt in Ordnung. Da mir das mit der langsamen Platte nicht aus dem Kopf gegangen ist, hab ich mal einen kleinen "Benchmark" (wenn mans so bezeichnen mag) für jede Platte gemacht. Dazu hab ich einfach mal ein paar GB an Daten auf die Platte geschaufelt:
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dd if=/dev/zero of=/dev/sda bs=4M count=10240Das hab ich für alle 4 Platten (also sda bis sdd) gemacht - und rein von der Logik her würde ich nun für die beiden Samsungs annähernd gleiche Werte erwarten - und ebenso bei den beiden WDs. Allerdings ist das Ergebnis doch eher seltsam:
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dd if=/dev/zero of=/dev/sda bs=4M count=10240 (Samsung HD153WI):
10240+0 records in
10240+0 records out
42949672960 bytes (43 GB) copied, 377,79 s, 114 MB/s
dd if=/dev/zero of=/dev/sdb bs=4M count=10240 (Samsung HD153WI):
10240+0 records in
10240+0 records out
42949672960 bytes (43 GB) copied, 387,139 s, 111 MB/s
dd if=/dev/zero of=/dev/sdc bs=4M count=10240 (Western Digital WD15EARS):
10240+0 records in
10240+0 records out
42949672960 bytes (43 GB) copied, 478,847 s, 89,7 MB/s
dd if=/dev/zero of=/dev/sdd bs=4M count=10240 (Western Digital WD15EARS):
10240+0 records in
10240+0 records out
42949672960 bytes (43 GB) copied, 362,43 s, 119 MB/sDie beiden Samsungs sind annähernd gleich schnell (bei bs=1M waren sie es mit 108MB/s), die beiden WDs unterscheiden sich aber deutlich (bei bs=1M war die sdc mit 84MB/s dabei, die sdd mit 105MB/s).
Hat jemand eine Idee, woran das liegen könnte? Die Platten sind jeweils gleich alt - die Samsungs haben bis auf die letzte Stelle sogar die selbe Seriennummer, die WDs nicht, sind aber beide vom selben Produktionstag. Die SATA-Kabel hab ich auch schon testweise getauscht, ebenso die Platten mal an andere SATA-Ports. Immer wieder lahmt die WD, die oben an sdc hing..
Hier noch die SMART-Werte für die beiden WDs:
Spoiler anzeigen
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smartctl 5.41 2011-03-16 r3296 [x86_64-unknown-linux-gnu-2.6.38-grml64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Green (Adv. Format) family
Device Model: WDC WD15EARS-00MVWB0
Serial Number: WD-WCAZA1384965
Firmware Version: 51.0AB51
User Capacity: 1.500.301.910.016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Jul 12 18:42:59 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x84) Offline data collection activity
was suspended by an interrupting command from host.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (37560) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x3035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 161 161 021 Pre-fail Always - 6950
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 210
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 317
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 200
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 186
193 Load_Cycle_Count 0x0032 199 199 000 Old_age Always - 4399
194 Temperature_Celsius 0x0022 116 106 000 Old_age Always - 34
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 3
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.Code
smartctl 5.41 2011-03-16 r3296 [x86_64-unknown-linux-gnu-2.6.38-grml64] (local build)
Copyright (C) 2002-11 by Bruce Allen, http://smartmontools.sourceforge.net
=== START OF INFORMATION SECTION ===
Model Family: Western Digital Caviar Green (Adv. Format) family
Device Model: WDC WD15EARS-00MVWB0
Serial Number: WD-WCAZA1394283
Firmware Version: 51.0AB51
User Capacity: 1.500.301.910.016 bytes
Device is: In smartctl database [for details use: -P show]
ATA Version is: 8
ATA Standard is: Exact ATA specification draft version not indicated
Local Time is: Thu Jul 12 18:43:02 2012 CEST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x82) Offline data collection activity
was completed without error.
Auto Offline Data Collection: Enabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: (28260) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 255) minutes.
Conveyance self-test routine
recommended polling time: ( 5) minutes.
SCT capabilities: (0x3035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x002f 200 200 051 Pre-fail Always - 0
3 Spin_Up_Time 0x0027 168 167 021 Pre-fail Always - 6591
4 Start_Stop_Count 0x0032 100 100 000 Old_age Always - 211
5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0
7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 335
10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0
11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 203
192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 192
193 Load_Cycle_Count 0x0032 199 199 000 Old_age Always - 4413
194 Temperature_Celsius 0x0022 118 107 000 Old_age Always - 32
196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0
197 Current_Pending_Sector 0x0032 200 200 000 Old_age Always - 0
198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 0
199 UDMA_CRC_Error_Count 0x0032 200 200 000 Old_age Always - 3
200 Multi_Zone_Error_Rate 0x0008 200 200 000 Old_age Offline - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.EDIT: Achja, hätt ich fast vergessen: Die beiden WDs sind jeweils auf 512Byte-Sektoren gejumpert - sind ja eigentlich Platten mit 4k-Sektoren.
